Magnetic microscopy/metrology potential of metamaterials using nanosized spherical particle arrays
Techniques for imaging and characterizing magnetic samples have been widely used in many areas of research involving magnetic materials. Nowadays, magnetic microscopy techniques play a critical role in characterizing magnetic thin film structures. In considering the various techniques, optical techniques offer some unique advantages over alternative techniques (e.g. MFM), as they are least affected by magnetic noise and, for the same underlying reasons, have also proven to be more suitable for...[Show more]
|Collections||ANU Research Publications|
|Source:||Proceedings of SPIE - The International Society for Optical Engineering|
|01_Eason_Magnetic_microscopy/metrology_2011.pdf||1.27 MB||Adobe PDF|
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