Influence of Annealing and Bulk Hydrogenation on Lifetime Limiting Defects in Nitrogen-Doped Floating Zone Silicon
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Rougieux, Fiacre; Grant, Nicholas; Barugkin (Qiaoke), Chog; MacDonald, Daniel; murphy, john
Description
A recombination active defect is found in as-grown high-purity floating zone n-type silicon wafers containing grown-in nitrogen. In order to identify the properties of the defect, injection-dependent minority carrier lifetime measurements, secondary ion mass spectroscopy measurements, and photoluminescence lifetime imaging are performed. The lateral recombination center distribution varies greatly in a radially symmetric way, while the nitrogen concentration remains constant. The defect is...[Show more]
dc.contributor.author | Rougieux, Fiacre | |
---|---|---|
dc.contributor.author | Grant, Nicholas | |
dc.contributor.author | Barugkin (Qiaoke), Chog | |
dc.contributor.author | MacDonald, Daniel | |
dc.contributor.author | murphy, john | |
dc.date.accessioned | 2015-12-08T22:37:29Z | |
dc.identifier.issn | 2156-3381 | |
dc.identifier.uri | http://hdl.handle.net/1885/35544 | |
dc.description.abstract | A recombination active defect is found in as-grown high-purity floating zone n-type silicon wafers containing grown-in nitrogen. In order to identify the properties of the defect, injection-dependent minority carrier lifetime measurements, secondary ion mass spectroscopy measurements, and photoluminescence lifetime imaging are performed. The lateral recombination center distribution varies greatly in a radially symmetric way, while the nitrogen concentration remains constant. The defect is shown to be deactivated through high temperature annealing and hydrogenation. We suggest that a nitrogen-intrinsic point defect complex may be responsible for the observed recombination. | |
dc.publisher | IEEE Electron Devices Society | |
dc.source | IEEE Journal of Photovoltaics | |
dc.title | Influence of Annealing and Bulk Hydrogenation on Lifetime Limiting Defects in Nitrogen-Doped Floating Zone Silicon | |
dc.type | Journal article | |
local.description.notes | Imported from ARIES | |
local.identifier.citationvolume | 5 | |
dc.date.issued | 2015 | |
local.identifier.absfor | 090605 - Photodetectors, Optical Sensors and Solar Cells | |
local.identifier.ariespublication | U5431022xPUB125 | |
local.type.status | Published Version | |
local.contributor.affiliation | Rougieux, Fiacre, College of Engineering and Computer Science, ANU | |
local.contributor.affiliation | Grant, Nicholas, College of Engineering and Computer Science, ANU | |
local.contributor.affiliation | Barugkin (Qiaoke), Chog, College of Engineering and Computer Science, ANU | |
local.contributor.affiliation | MacDonald, Daniel, College of Engineering and Computer Science, ANU | |
local.contributor.affiliation | murphy, john, University of Warwick | |
local.description.embargo | 2037-12-31 | |
local.bibliographicCitation.issue | 2 | |
local.bibliographicCitation.startpage | 495 | |
local.identifier.doi | 10.1109/JPHOTOV.2014.2367912 | |
local.identifier.absseo | 850504 - Solar-Photovoltaic Energy | |
dc.date.updated | 2015-12-08T09:59:40Z | |
local.identifier.scopusID | 2-s2.0-84923935966 | |
Collections | ANU Research Publications |
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