Structural relaxation and optical properties in amorphous Ge33 As12 Se55 films
Amorphous Ge33As12S55 films prepared by ultra fast pulsed laser deposition (PLD) have been vacuum annealed over a range of different temperatures. Raman scattering measurements indicated that the features corresponding to Ge-Se and As-Se clusters increase in intensity with increasing annealing temperature (Ta) up to their respective glass transition temperature, and then decrease with further increasing Ta up to 300 °C. Optical property measurements showed that the refractive index deceases but...[Show more]
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|Source:||Journal of Non-crystalline Solids|
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