Pore scale analysis of electrical resistivity in complex core material
Knackstedt, Mark; Arns, Christoph; Sheppard, Adrian; Senden, Timothy; Sok, Robert; Cinar, Yildiray; Olafuyi, A.O.; Pinczewski, Wolf Val; Padhy, Girija; Ioannidis, Marios A
| Collections | ANU Research Publications |
|---|---|
| Date published: | 2007 |
| Type: | Conference paper |
| URI: | http://hdl.handle.net/1885/31750 |
| Source: | Proceedings of International Symposium of the Society of Core Analysts 2007 |
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| File | Description | Size | Format | Image |
|---|---|---|---|---|
| 01_Knackstedt_Pore_scale_analysis_of_2007.pdf | 1.39 MB | Adobe PDF | Request a copy | |
| 02_Knackstedt_Pore_scale_analysis_of_2007.pdf | 1.26 MB | Adobe PDF | Request a copy |
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