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High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential

Uhlig, J; Doriese, W.B.; Fowler, J.W.; Swetz, D.S.; Jaye, C.; Fischer, D.A.; Reintsema, C.D.; Bennett, D.A.; Vale, L.R.; Mandal, U.; O'Neil, G.C.; Miaja-Avila, L.; Joe, Y.I.; El Nahhas, A.; Fullagar, Wilfred; Parnefjord Gustafsson, F.; Sundström, V.; Kurunthu, D.; Hilton, G.C.; Schmidt, D.R.; Ullom, J.N.

Description

X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength-dispersive X-ray spectrometer technology has limited the use of XES, especially in combination with weaker laboratory X-ray sources. More efficient energy-dispersive detectors have either insufficient energy resolution...[Show more]

dc.contributor.authorUhlig, J
dc.contributor.authorDoriese, W.B.
dc.contributor.authorFowler, J.W.
dc.contributor.authorSwetz, D.S.
dc.contributor.authorJaye, C.
dc.contributor.authorFischer, D.A.
dc.contributor.authorReintsema, C.D.
dc.contributor.authorBennett, D.A.
dc.contributor.authorVale, L.R.
dc.contributor.authorMandal, U.
dc.contributor.authorO'Neil, G.C.
dc.contributor.authorMiaja-Avila, L.
dc.contributor.authorJoe, Y.I.
dc.contributor.authorEl Nahhas, A.
dc.contributor.authorFullagar, Wilfred
dc.contributor.authorParnefjord Gustafsson, F.
dc.contributor.authorSundström, V.
dc.contributor.authorKurunthu, D.
dc.contributor.authorHilton, G.C.
dc.contributor.authorSchmidt, D.R.
dc.contributor.authorUllom, J.N.
dc.date.accessioned2015-12-08T22:18:47Z
dc.identifier.issn0909-0495
dc.identifier.urihttp://hdl.handle.net/1885/31505
dc.description.abstractX-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength-dispersive X-ray spectrometer technology has limited the use of XES, especially in combination with weaker laboratory X-ray sources. More efficient energy-dispersive detectors have either insufficient energy resolution because of the statistical limits described by Fano or too low counting rates to be of practical use. This paper updates an approach to high-resolution X-ray emission spectroscopy that uses a microcalorimeter detector array of superconducting transition-edge sensors (TESs). TES arrays are discussed and compared with conventional methods, and shown under which circumstances they are superior. It is also shown that a TES array can be integrated into a table-top time-resolved X-ray source and a soft X-ray synchrotron beamline to perform emission spectroscopy with good chemical sensitivity over a very wide range of energies.
dc.publisherMunksgaard International Publishers
dc.sourceJournal of Synchrotron Radiation
dc.titleHigh-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential
dc.typeJournal article
local.description.notesImported from ARIES
local.identifier.citationvolume22
dc.date.issued2015
local.identifier.absfor020503 - Nonlinear Optics and Spectroscopy
local.identifier.absfor030606 - Structural Chemistry and Spectroscopy
local.identifier.absfor029904 - Synchrotrons; Accelerators; Instruments and Techniques
local.identifier.ariespublicationu8606713xPUB83
local.type.statusPublished Version
local.contributor.affiliationUhlig, J, Lund University
local.contributor.affiliationDoriese, W.B., National Institute of Standards and Technology
local.contributor.affiliationFowler, J.W., National Institute of Standards and Technology
local.contributor.affiliationSwetz, D.S., National Institute of Standards and Technology
local.contributor.affiliationJaye, C., National Institute of Standards and Technology
local.contributor.affiliationFischer, D.A., National Institute of Standards and Technology
local.contributor.affiliationReintsema, C.D., National Institute of Standards and Technology
local.contributor.affiliationBennett, D.A., National Institute of Standards and Technology
local.contributor.affiliationVale, L.R., National Institute of Standards and Technology
local.contributor.affiliationMandal, U., Lund University
local.contributor.affiliationO'Neil, G.C., National Institute of Standards and Technology
local.contributor.affiliationMiaja-Avila, L., National Institute of Standards and Technology
local.contributor.affiliationJoe, Y.I., National Institute of Standards and Technology
local.contributor.affiliationEl Nahhas, A., Lund University
local.contributor.affiliationFullagar, Wilfred, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationParnefjord Gustafsson, F., Lund University
local.contributor.affiliationSundström, V., Lund University
local.contributor.affiliationKurunthu, D., Lund University
local.contributor.affiliationHilton, G.C., National Institute of Standards and Technology
local.contributor.affiliationSchmidt, D.R., National Institute of Standards and Technology
local.contributor.affiliationUllom, J.N., National Institute of Standards and Technology
local.description.embargo2037-12-31
local.bibliographicCitation.startpage1
local.bibliographicCitation.lastpage10
local.identifier.doi10.1107/S1600577515004312
dc.date.updated2015-12-08T08:19:18Z
local.identifier.scopusID2-s2.0-84929470687
CollectionsANU Research Publications

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