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High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential

Uhlig, J; Doriese, W.B.; Fowler, J.W.; Swetz, D.S.; Jaye, C.; Fischer, D.A.; Reintsema, C.D.; Bennett, D.A.; Vale, L.R.; Mandal, U.; O'Neil, G.C.; Miaja-Avila, L.; Joe, Y.I.; El Nahhas, A.; Fullagar, Wilfred; Parnefjord Gustafsson, F.; Sundström, V.; Kurunthu, D.; Hilton, G.C.; Schmidt, D.R.; Ullom, J.N.


X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength-dispersive X-ray spectrometer technology has limited the use of XES, especially in combination with weaker laboratory X-ray sources. More efficient energy-dispersive detectors have either insufficient energy resolution...[Show more]

CollectionsANU Research Publications
Date published: 2015
Type: Journal article
Source: Journal of Synchrotron Radiation
DOI: 10.1107/S1600577515004312


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