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Determination of injection dependent recombination properties of locally processed surface regions

Fell, Andreas; Walters, Daniel; Kluska, Sven; Franklin, Evan; Weber, Klaus

Description

High efficiency solar cell concepts typically depend upon highly localized processing technologies, such as partial rear contacts. In practice, characterizing these techniques is challenging and it has become increasingly popular to employ analytical expressions that fit the local surface recombination velocity (SRV) to area-averaged measurements of regularly arrayed test structures. However, this approach has numerous limitations imposed by the assumptions of the model and as a consequence...[Show more]

dc.contributor.authorFell, Andreas
dc.contributor.authorWalters, Daniel
dc.contributor.authorKluska, Sven
dc.contributor.authorFranklin, Evan
dc.contributor.authorWeber, Klaus
dc.date.accessioned2015-12-08T22:16:47Z
dc.identifier.issn1876-6102
dc.identifier.urihttp://hdl.handle.net/1885/30834
dc.description.abstractHigh efficiency solar cell concepts typically depend upon highly localized processing technologies, such as partial rear contacts. In practice, characterizing these techniques is challenging and it has become increasingly popular to employ analytical expressions that fit the local surface recombination velocity (SRV) to area-averaged measurements of regularly arrayed test structures. However, this approach has numerous limitations imposed by the assumptions of the model and as a consequence significant inaccuracies can result. We present an alternative approach with improved accuracy and generality, which makes use of the recently developed fast 2D/3D device simulator Quokka. Quokka has been enhanced to predict luminescence as well as photoconductance (PC). Thus the recombination activity of the locally processed feature can be iteratively found to fit the measurement result of a test sample. The power of this technique is demonstrated by the derivation of the recombination current density as a function of the excess carrier density directly at the local feature from area-averaged photoluminescence (PL) signals. We apply the method to different laser-doped samples, which reveal accurate and consistent trends for a range of pitches and injection levels as well as a low sensitivity to the uncertainty of input parameters.
dc.publisherElsevier
dc.sourceEnergy Procedia
dc.titleDetermination of injection dependent recombination properties of locally processed surface regions
dc.typeJournal article
local.description.notesImported from ARIES
local.identifier.citationvolume2013
dc.date.issued2013
local.identifier.absfor090605 - Photodetectors, Optical Sensors and Solar Cells
local.identifier.ariespublicationu5114172xPUB77
local.type.statusPublished Version
local.contributor.affiliationFell, Andreas, College of Engineering and Computer Science, ANU
local.contributor.affiliationWalters, Daniel, College of Engineering and Computer Science, ANU
local.contributor.affiliationKluska, Sven, Fraunhofer Institute for Solar Energy Systems
local.contributor.affiliationFranklin, Evan, College of Engineering and Computer Science, ANU
local.contributor.affiliationWeber, Klaus, College of Engineering and Computer Science, ANU
local.description.embargo2037-12-31
local.bibliographicCitation.issue38
local.bibliographicCitation.startpage22
local.bibliographicCitation.lastpage31
local.identifier.doi10.1016/j.egypro.2013.07.245
local.identifier.absseo850504 - Solar-Photovoltaic Energy
dc.date.updated2015-12-08T08:04:27Z
local.identifier.scopusID2-s2.0-84891555157
CollectionsANU Research Publications

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