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Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

Chen, Ying; Chen, Hua; Yu, Jun; Williams, James S.; Craig, Vince

Description

Focused ion beam FIB milling system has been used to create nanosized patterns as the template for patterned growth of carbon nanotubes on Si substrate surface without predeposition of metal catalysts. Carbon nanotubes only nucleate and grow on the template under controlled pyrolysis of iron phthalocyanine at 1000 °C. The size, growth direction, and density of the patterned nanotubes can be controlled under different growth conditions and template sizes. Atomic force microscopy and...[Show more]

CollectionsANU Research Publications
Date published: 2007
Type: Journal article
URI: http://hdl.handle.net/1885/26937
Source: Applied Physics Letters
DOI: 10.1063/1.2710785

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