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Synthesis and characterization of ion-implanted Pt nanocrystals in SiO 2

Giulian, Raquel; Kluth, Patrick; Johannessen, Bernt; Araujo, Leandro; Llewellyn, David; Cookson, D J; Ridgway, Mark C


Pt nanocrystals (NCs) produced by ion implantation in SiO2 films were investigated by Rutherford backscattering spectroscopy (RBS), transmission electron microscopy (TEM) and small angle X-ray scattering (SAXS). The implantations were performed at liquid

CollectionsANU Research Publications
Date published: 2007
Type: Journal article
Source: Nuclear Instruments and Methods in Physics Research: Section B
DOI: 10.1016/j.nimb.2006.12.139


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