Synthesis and characterization of ion-implanted Pt nanocrystals in SiO 2
Pt nanocrystals (NCs) produced by ion implantation in SiO2 films were investigated by Rutherford backscattering spectroscopy (RBS), transmission electron microscopy (TEM) and small angle X-ray scattering (SAXS). The implantations were performed at liquid
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|Source:||Nuclear Instruments and Methods in Physics Research: Section B|
|01_Giulian_Synthesis_and_characterization_2007.pdf||288.64 kB||Adobe PDF||Request a copy|
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