Skip navigation
Skip navigation

Imaging and modelling the internal gettering of interstitial iron by grain boundaries in multicrystalline silicon

Liu, An Yao; Walters, Daniel; Phang, Sieu Pheng; MacDonald, Daniel

Description

In this paper a simple one-dimensional diffusion-capture model is used to effectively characterise the reduction in interstitial Fe concentrations near grain boundaries in multicrystalline silicon by two fitting parameters: the diffusion length of Fe atoms and the gettering velocity at the grain boundary. The measurements are achieved by photoluminescence images taken before and after dissociating FeB pairs in silicon. The measurement artefacts of lateral photon scattering and lateral carrier...[Show more]

CollectionsANU Research Publications
Date published: 2012
Type: Conference paper
URI: http://hdl.handle.net/1885/25134
Source: Proceedings of the 38th IEEE Photovoltaic Specialists Conference (PVSC)
DOI: 10.1109/PVSC.2012.6317611

Download

File Description SizeFormat Image
01_Liu_Imaging_and_modelling_the_2012.pdf1.09 MBAdobe PDF    Request a copy


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  12 November 2018/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator