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Kondo-like behavior in ThAsSe and UAsSe

Schoenes, J; Withers, Raymond; Hulliger, F

Description

Diamagnetic ThAsSe and ferromagnetic UAsSe display negative temperature coefficients of the electrical resistivity over extended temperature ranges. Electron-diffraction studies show that As-As dimerizations within the As layers cause this Kondo-like behavior in ThAsSe and do also contribute in UAsSe. We suggest that a coupling between neighboring As layers at the lowest temperatures may be at the origin of a second Kondo-like regime below ≈15 K.

CollectionsANU Research Publications
Date published: 2007
Type: Journal article
URI: http://hdl.handle.net/1885/23504
Source: Journal of Magnetism and Magnetic Materials
DOI: 10.1016/j.jmmm.2006.10.672

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