Department of Electronic Materials Engineering's Secondary Ion Mass Spectrometer performing a diagnostic analysis on a silicon chip
|Collections||Campus and Buildings|
|Title:||Department of Electronic Materials Engineering's Secondary Ion Mass Spectrometer performing a diagnostic analysis on a silicon chip|
|Series/Report no.:||AU ANUA 226 - Photographs of Buildings and Events at the Australian National University|
|Description:||Research School of Information Sciences and Engineering - Opening of Faculty, Equipment - Sen. Schacht, Rob Gresham, Prof. Daryl Williamson & others|
|Other Identifiers:||AU ANUA 226-673|
|AU ANUA 226-673_0005_a.tif||19.4 MB||TIFF|
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