Uncertainty in Photoluminescence Metrology on Multicrystalline Silicon Bricks and Cross Validation With Wafers
Bulk lifetime and interstitial iron concentration are two pertinent parameters describing the quality of multicrystalline silicon, which can be measured on silicon bricks using photoluminescence (PL) imaging. Multicrystalline silicon is inherently variable, therefore accurate measurements are valuable for quality control and process improvement. In this study, the uncertainty of PL extracted lifetime and interstitial iron concentration measurements was assessed by consideration of the random...[Show more]
|Collections||ANU Research Publications|
|Source:||IEEE Journal of Photovoltaics|
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