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Optical Evaluation of Silicon Wafers With Rounded Rear Pyramids

McIntosh, Keith; Zin, Ngwe Soe; Nguyen, Hieu; Stocks, Matthew; Franklin, Evan; Fong, Kean; Kho, Teng; Chong, Teck; Wang, Er-Chien; Ratcliff, Tom; MacDonald, Daniel; Blakers, Andrew

Description

We investigate the light trapping in Si wafers that are textured with conventional random pyramids on their front surface and rounded random pyramids on their rear. It is well established that rounding the pyramids leads to better surface passivation, but whether or not it improves light trapping depends on the cell structure. In this paper, we apply ray tracing, spectrophotometry, and photoluminescence spectroscopy (PLS) to understand and quantify how rounding the rear pyramids might affect...[Show more]

CollectionsANU Research Publications
Date published: 2017
Type: Journal article
URI: http://hdl.handle.net/1885/218287
Source: IEEE Journal of Photovoltaics
DOI: 10.1109/JPHOTOV.2017.2754060

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