Accounting for the Dependence of Coil Sensitivity on Sample Thickness and Lift-Off in Inductively Coupled Photoconductance Measurements
Inductively coupled photoconductance measurements are widely used to characterize carrier recombination in crystalline silicon. We show that, contrary to what is usually supposed, the sensitivity of such measurements is significantly dependent on sample thickness in the range of typical wafer thicknesses, due to the attenuation of the magnetic field with distance from the coil. Sample thickness, as well as any separation from the coil, should, therefore, be taken into account in system...[Show more]
|Collections||ANU Research Publications|
|Source:||IEEE Journal of Photovoltaics|
|01_Black_Accounting_for_the_Dependence_2019.pdf||1.87 MB||Adobe PDF||Request a copy|
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.