Skip navigation
Skip navigation

Accounting for the Dependence of Coil Sensitivity on Sample Thickness and Lift-Off in Inductively Coupled Photoconductance Measurements

Black, Lachlan; Macdonald, Daniel

Description

Inductively coupled photoconductance measurements are widely used to characterize carrier recombination in crystalline silicon. We show that, contrary to what is usually supposed, the sensitivity of such measurements is significantly dependent on sample thickness in the range of typical wafer thicknesses, due to the attenuation of the magnetic field with distance from the coil. Sample thickness, as well as any separation from the coil, should, therefore, be taken into account in system...[Show more]

CollectionsANU Research Publications
Date published: 2019
Type: Journal article
URI: http://hdl.handle.net/1885/216683
Source: IEEE Journal of Photovoltaics
DOI: 10.1109/JPHOTOV.2019.2942484

Download

File Description SizeFormat Image
01_Black_Accounting_for_the_Dependence_2019.pdf1.87 MBAdobe PDF    Request a copy


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  19 May 2020/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator