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High external quantum efficiency of planar semiconductor structures

Catchpole, Kylie; Lin, K.L.; Campbell, Patrick; Green, Martin Andrew; Bett, A.W; Dimroth, F

Description

We have measured a very high photoluminescence external quantum efficiency (EQE) of 92% for a GaAs/GaInP double heterostructure mounted on a planar substrate. The measurement was made using a system we developed for accurately measuring the external quantum efficiency of highly radiatively efficient structures. The technique involves measuring uncalibrated photoluminescence and thermal signals from an optically pumped structure, as a function of incident laser power. The ac measurement...[Show more]

dc.contributor.authorCatchpole, Kylie
dc.contributor.authorLin, K.L.
dc.contributor.authorCampbell, Patrick
dc.contributor.authorGreen, Martin Andrew
dc.contributor.authorBett, A.W
dc.contributor.authorDimroth, F
dc.date.accessioned2015-12-07T22:25:45Z
dc.identifier.issn0268-1242
dc.identifier.urihttp://hdl.handle.net/1885/21443
dc.description.abstractWe have measured a very high photoluminescence external quantum efficiency (EQE) of 92% for a GaAs/GaInP double heterostructure mounted on a planar substrate. The measurement was made using a system we developed for accurately measuring the external quantum efficiency of highly radiatively efficient structures. The technique involves measuring uncalibrated photoluminescence and thermal signals from an optically pumped structure, as a function of incident laser power. The ac measurement technique allows the direct measurement of microkelvin temperature differences at room temperature, and also allows the Auger coefficient for intrinsic GaAs to be determined at relatively low injection levels.
dc.publisherInstitute of Physics Publishing
dc.sourceSemiconductor Science and Technology
dc.titleHigh external quantum efficiency of planar semiconductor structures
dc.typeJournal article
local.description.notesImported from ARIES
local.identifier.citationvolume19
dc.date.issued2004
local.identifier.absfor091200 - MATERIALS ENGINEERING
local.identifier.ariespublicationu4010714xPUB17
local.type.statusPublished Version
local.contributor.affiliationCatchpole, Kylie, College of Engineering and Computer Science, ANU
local.contributor.affiliationLin, K.L., University of New South Wales
local.contributor.affiliationCampbell, Patrick, University of New South Wales
local.contributor.affiliationGreen, Martin Andrew, University of New South Wales
local.contributor.affiliationBett, A.W, Fraunhofer Institute
local.contributor.affiliationDimroth, F, Fraunhofer Institute
local.description.embargo2037-12-31
local.bibliographicCitation.issue11
local.bibliographicCitation.startpage1232
local.bibliographicCitation.lastpage1235
local.identifier.doi10.1088/0268-1242/19/11/003
dc.date.updated2015-12-07T09:40:41Z
local.identifier.scopusID2-s2.0-9144249839
CollectionsANU Research Publications

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