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Silicon photoluminescence external quantum efficiency determined by combined thermal/photoluminescence measurements

Catchpole, Kylie


A high photoluminescence external quantum efficiency (EQE) of 3.1% has been measured for a passivated, textured silicon wafer using a combined thermal and photoluminescence technique. This result shows that the high photoluminescence EQEs reported recently, which were achieved using calibrated photoluminescence measurements, are confirmed with an entirely independent measurement technique. The technique involves measuring uncalibrated photoluminescence and thermal signals from an optically...[Show more]

CollectionsANU Research Publications
Date published: 2004
Type: Journal article
Source: Semiconductor Science and Technology
DOI: 10.1088/0268-1242/19/12/014


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