Skip navigation
Skip navigation

Terahertz Emission and Lifetime Measurements of Ion-implanted Semiconductors: Experiment and Simulation

Lloyd-Hughes, J; Castro-Camus, E; Fraser, Michael; Jagadish, Chennupati; Johnston, Michael B; Tan, Hark Hoe

Description

The spectral width of terahertz emission from ion-implanted terahertz emitters increases with ion damage, owing to ultrafast carrier capture. Carrier dynamics simulations reinforce these findings. Optical-pump, terahertz-probe experiments confirm the subpicosecond lifetimes of these materials.

dc.contributor.authorLloyd-Hughes, J
dc.contributor.authorCastro-Camus, E
dc.contributor.authorFraser, Michael
dc.contributor.authorJagadish, Chennupati
dc.contributor.authorJohnston, Michael B
dc.contributor.authorTan, Hark Hoe
dc.coverage.spatialLong Beach USA
dc.date.accessioned2015-12-07T22:25:13Z
dc.date.createdMay 21-26 2006
dc.identifier.isbn1557528136
dc.identifier.urihttp://hdl.handle.net/1885/21162
dc.description.abstractThe spectral width of terahertz emission from ion-implanted terahertz emitters increases with ion damage, owing to ultrafast carrier capture. Carrier dynamics simulations reinforce these findings. Optical-pump, terahertz-probe experiments confirm the subpicosecond lifetimes of these materials.
dc.publisherOptical Society of America
dc.relation.ispartofseriesConference on Lasers and Electro-Optics, Quantum Electronics and Laser Science/Conference on Photonic Applications, Systems and Technologies (CLEO/QELS 2006)
dc.sourceConference on Lasers and Electro-Optics Quantum Electronics and Laser Science: Conference on Photonic Applications, Systems and Technologies: Technical Digest CD-ROM
dc.subjectKeywords: Civil aviation; Electron optics; Ions; Lasers; Optical pumping; Quantum electronics; Carrier dynamics; Ion damages; Life-times; Lifetime measurements; Optical-; Semi-conductors; Spectral widths; Subpicosecond; Terahertz; Terahertz emissions; Terahertz emi
dc.titleTerahertz Emission and Lifetime Measurements of Ion-implanted Semiconductors: Experiment and Simulation
dc.typeConference paper
local.description.notesImported from ARIES
local.description.refereedYes
dc.date.issued2006
local.identifier.absfor100799 - Nanotechnology not elsewhere classified
local.identifier.absfor020501 - Classical and Physical Optics
local.identifier.ariespublicationu8606713xPUB15
local.type.statusPublished Version
local.contributor.affiliationLloyd-Hughes, J, University of Oxford
local.contributor.affiliationCastro-Camus, E, University of Oxford
local.contributor.affiliationFraser, Michael, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationTan, Hoe Hark, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationJagadish, Chennupati, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationJohnston, Michael B, University of Oxford
local.description.embargo2037-12-31
local.bibliographicCitation.startpageJTuD18-1-2
local.identifier.doi10.1109/CLEO.2006.4628606
dc.date.updated2016-02-24T11:40:41Z
local.identifier.scopusID2-s2.0-55649104982
CollectionsANU Research Publications

Download

File Description SizeFormat Image
01_Lloyd-Hughes_Terahertz_Emission_and_2006.pdf103.13 kBAdobe PDF    Request a copy


Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  19 May 2020/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator