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Imaging the Thickness of Passivation Layers for Crystalline Silicon with Micron-Scale Spatial Resolution Using Spectral Photoluminescence

Nguyen, Hieu; Johnston, Steve; Basnet, Rabin; Guthrey, Harvey; Dippo, Pat; Zhang, Hanyu; Al-Jassim, Mowafak M; Macdonald, Daniel

Description

Thin films deposited on crystalline silicon surfaces are critical components of many silicon‐based devices, including high‐efficiency photovoltaic cells. Knowledge of their optical and electronic properties is important in designing and fabricating efficient solar cells, especially as the device complexity increases and includes micron‐scale features. Here, a camera‐based photoluminescence (PL) technique is developed to image the thickness of specific passivating films on silicon wafers. The...[Show more]

CollectionsANU Research Publications
Date published: 2017
Type: Journal article
URI: http://hdl.handle.net/1885/203310
Source: RRL Solar
DOI: 10.1002/solr.201700157

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