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Multiple Scattering Effects on the EXAFS of Ge Nanocrystals

Araujo, Leandro; Ridgway, Mark C; Foran, Garry J


We present a detailed extended x-ray absorption fine structure (EXAFS) spectroscopy study on the influence of multiple scattering effects on the analysis of bulk polycrystalline Ge (c-Ge) and of four Ge nanocrystal (NC) distributions with mean sizes from

CollectionsANU Research Publications
Date published: 2008
Type: Journal article
Source: Journal of Synchrotron Radiation
DOI: 10.1088/0953-8984/20/16/165210


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