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Nonlinear absorption and refraction in crystalline silicon in the mid-infrared

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Gai, Xin; Yu, Yi; Kuyken, Bart; Ma, Pan; Madden, Steve; Campenhout, Joris Van; Verheyen, Peter; Roelkens, Gunther; Baets, Roel; Luther-Davies, Barry

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The wavelength dependence of the nonlinear absorption and the third order nonlinear refraction of crystalline silicon between 2.75μm and 5.5μm as well as at 1.55μm have been measured. It was found that at all wavelengths multi-photon and free carrier a

CollectionsANU Research Publications
Date published: 2013
Type: Journal article
URI: http://hdl.handle.net/1885/18084
Source: Laser and Photonics Reviews
DOI: 10.1002/lpor.201300103

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