Koenderink, A Femius; Wüest, R.; Buchler, Benjamin; Richter, S.; Strasser, P; Kafesaki, Maria; Rogach, A.; Wehrspohn, R.B.; Soukoulis, C.M.; Erni, D.; Robin, F.; Jackel, H.; Sandoghdar, Vahid
We discuss recent progress and the exciting potential of scanning probe microscopy methods for the characterization and control of photonic crystals. We demonstrate that scanning near-field optical microscopy can be used to characterize the performance of photonic crystal device components on the sub-wavelength scale. In addition, we propose scanning probe techniques for realizing local, low-loss tuning of photonic crystal resonances, based on the frequency shifts that high-index nanoscopic...[Show more]
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