Skip navigation
Skip navigation

Vibrational Properties of Ge Nanocrystals determined by EXAFS

Araujo, Leandro; Kluth, Patrick; Azevedo, G de M; Ridgway, Mark C


Extended x-ray absorption fine structure (EXAFS) spectroscopy was applied to probe the vibrational properties of bulk crystalline Ge (c-Ge) and Ge nanocrystals (Ge NCs) of 4.4 nm mean diameter produced by ion implantation in Si O2 followed by thermal annealing. EXAFS measurements around the Ge K edge were carried out in the temperature range from 8 to 300 K at beam line 10-2 of the Stanford Synchrotron Radiation Laboratory (SSRL). Original information about thermal and static disorder, thermal...[Show more]

CollectionsANU Research Publications
Date published: 2006
Type: Journal article
Source: Physical Review B: Condensed Matter and Materials
DOI: 10.1103/PhysRevB.74.184102


File Description SizeFormat Image
01_Araujo_Vibrational_Properties_of_Ge_2006.pdf555.9 kBAdobe PDF    Request a copy

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator