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Impurity Gettering by Diffusion-doped Polysilicon Passivating Contacts for Silicon Solar Cells

Liu, An Yao; Yan, Di; Wong-Leung, Jennifer; Li, Li (Lily); Phang, Sieu Pheng; Cuevas, Andres; Macdonald, Daniel

Description

We report direct experimental evidence for the strong impurity gettering effects associated with the formation of diffusion-doped polysilicon passivating contacts. Iron is used as a marker impurity in silicon to quantify the gettering effectiveness. By monitoring the iron redistribution from the silicon wafer bulk to the polysilicon surface layers, via a combination of carrier lifetime, secondary ion mass spectrometry (SIMS), and transmission electron microscopy (TEM) techniques, the respective...[Show more]

CollectionsANU Research Publications
Date published: 2018-06-10
Type: Conference paper
URI: http://hdl.handle.net/1885/173089
Source: 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
DOI: 10.1109/PVSC.2018.8547431

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