Raman piezospectroscopic evaluation of intergrowth ferroelectric polycrystalline ceramic in biaxial bending configuration

Abstract

The piezospectroscopic (PS) effect was studied in an intergrowth bismuth layer-structure ferroelectricceramicBi₅TiNbWO₁₅ according to a micro-Raman spectroscopic evaluation. By using a ball-on-ring flexure configuration, a biaxial stress was generated in a Bi₅TiNbWO₁₅ plate-like specimen and in situ collected Raman spectra were acquired and analyzed under several loading conditions. As the observed spectral line contained signals arising from the whole illuminated in-depth region, the laser probe information was deconvoluted (by means of an in-depth probe response function obtained according to the defocusing method) in order to deduce biaxial PS coefficients for the three Raman bands of Bi₅TiNbWO₁₅ located at 763, 857, and 886 cm−1, respectively. The biaxial PS coefficients of these bands were derived to be −1.74±0.16, −2.51±0.16, and −2.64±0.31 cm⁻¹/GPa, respectively, and should be referred to the c axis of the Bi5TiNbWO15 crystal.