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Two distinct dielectric relaxation mechanisms in the low-frequency range in Bi₅TiNbWO₁₅ ceramics

Yi, Z. G.; Li, Y. X.; Wang, Y.; Yin, Q. R.


The ac data in terms of impedance and dielectric loss(tanδ) were exploited simultaneously to probe the dielectric relaxation mechanisms in Bi₅TiNbWO₁₅ceramics. It was found that two distinct relaxation mechanisms exist in the low-frequency range (10Hz–5MHz). One is attributed to the grain boundaryrelaxation and the other is associated with oxygen ion diffusion. Furthermore, the temperature dependence of the oxygen vacancyrelaxation strength is analogous to the Curie-Weiss law and follows the...[Show more]

CollectionsANU Research Publications
Date published: 2006-04-21
Type: Journal article
Source: Applied Physics Letters
DOI: 10.1063/1.2191953


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