Lanthanum distribution and dielectric properties of intergrowth Bi₅ˍₓLaₓTiNbWO₁₅ ferroelectrics
Bi₅ˍₓLaₓTiNbWO₁₅ (x=0–1.50)ceramics prepared by conventional solid-state reaction were studied using x-ray diffraction(XRD),dielectric spectroscopy and Raman scattering techniques. The XRD analysis implied that single-phase intergrowth bismuth layered perovskite structure was obtained for all the samples and when x=0.75, the Bi³⁺ in (Bi₂O₂)²⁺ layer begins to be substituted by La³⁺. The dielectric spectra showed that, when Bi³⁺ in (Bi₂O₂)²⁺ is substituted, the Curie temperature becomes diffusive...[Show more]
|Collections||ANU Research Publications|
|Source:||Applied Physics Letters|
|01_Yi_Lanthanum_distribution_and_2005.pdf||92.89 kB||Adobe PDF|
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