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Lanthanum distribution and dielectric properties of intergrowth Bi₅ˍₓLaₓTiNbWO₁₅ ferroelectrics

Yi, Z. G.; Li, Y. X.; Zeng, J. T.; Yang, Q. B.; Wang, D.; Lu, Y. Q.; Yin, Q. R.


Bi₅ˍₓLaₓTiNbWO₁₅ (x=0–1.50)ceramics prepared by conventional solid-state reaction were studied using x-ray diffraction(XRD),dielectric spectroscopy and Raman scattering techniques. The XRD analysis implied that single-phase intergrowth bismuth layered perovskite structure was obtained for all the samples and when x=0.75, the Bi³⁺ in (Bi₂O₂)²⁺ layer begins to be substituted by La³⁺. The dielectric spectra showed that, when Bi³⁺ in (Bi₂O₂)²⁺ is substituted, the Curie temperature becomes diffusive...[Show more]

CollectionsANU Research Publications
Date published: 2005-11-08
Type: Journal article
Source: Applied Physics Letters
DOI: 10.1063/1.2132077


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