Xu, Jinbao; Liu, Yun; Withers, Ray L.; Brink, Frank; Yang, Hui; Wang, Mark
Polycrystalline Bi₀.₅Na₀.₅TiO₃ (NBT) thin films have been successfully fabricated via a metal organic decomposition process on Pt/Ti/SiO₂/Si substrates. The structural evolution of the as-prepared thin filmsannealed over the moderate temperature range 500–700 °C is studied. NBT thin filmsannealed at 700 °C are of single phase NBT perovskite type. They exhibit a well-defined P-E hysteresis loop at room temperature. The measured dielectric constant is 465–410 over the frequency range of 1 kHz to...[Show more]
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