Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules
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Lange, M.; Matsumoto, J.; Setiawan, A.; Panajotović, R.; Harrison, J.; Lower, J. C. A.; Newman, D. S.; Mondal, S.; Buckman, Stephen
Description
This article presents a new type of low-energy crossed-beam electron spectrometer for measuring angular differential cross sections of electron-impact excitation of atomic and molecular targets. Designed for investigations at energies close to excitation thresholds, the spectrometer combines a pulsed electron beam with the time-of-flight technique to distinguish between scattering channels. A large-area, position-sensitive detector is used to offset the low average scattering rate resulting...[Show more]
Collections | ANU Research Publications |
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Date published: | 2008-04-28 |
Type: | Journal article |
URI: | http://hdl.handle.net/1885/16619 |
Source: | Review of Scientific Instruments |
DOI: | 10.1063/1.2912824 |
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01_Lange_Angle-resolving_time-of-flight_2008.pdf | Published Version | 172.31 kB | Adobe PDF |
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