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Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules

Lange, M.; Matsumoto, J.; Setiawan, A.; Panajotović, R.; Harrison, J.; Lower, J. C. A.; Newman, D. S.; Mondal, S.; Buckman, Stephen

Description

This article presents a new type of low-energy crossed-beam electron spectrometer for measuring angular differential cross sections of electron-impact excitation of atomic and molecular targets. Designed for investigations at energies close to excitation thresholds, the spectrometer combines a pulsed electron beam with the time-of-flight technique to distinguish between scattering channels. A large-area, position-sensitive detector is used to offset the low average scattering rate resulting...[Show more]

CollectionsANU Research Publications
Date published: 2008-04-28
Type: Journal article
URI: http://hdl.handle.net/1885/16619
Source: Review of Scientific Instruments
DOI: 10.1063/1.2912824

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