Formation and structural characterization of Ni nanoparticles embedded in SiO₂
Download (2.31 MB)
-
Altmetric Citations
Sprouster, D. J.; Giulian, R.; Araujo, L. L.; Kluth, P.; Johannessen, B.; Kirby, N.; Ridgway, M. C.
Description
Face-centered cubic Ni nanoparticles were formed in SiO₂ by ion implantation and thermal annealing. Small-angle x-ray scattering in conjunction with transmission electron microscopy was used to determine the nanoparticle size as a function of annealing temperature, whereas the local atomic structure was measured with x-ray absorption spectroscopy. The influence of finite-size effects on the nanoparticle structural properties was readily apparent and included a decrease in coordination number...[Show more]
Collections | ANU Research Publications |
---|---|
Date published: | 2011-06-07 |
Type: | Journal article |
URI: | http://hdl.handle.net/1885/16530 |
Source: | Journal of Applied Physics |
DOI: | 10.1063/1.3594751 |
Download
File | Description | Size | Format | Image |
---|---|---|---|---|
01_Sprouster_Formation_and_structural_2011.pdf | Published Version | 2.31 MB | Adobe PDF | ![]() |
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.
Updated: 19 May 2020/ Responsible Officer: University Librarian/ Page Contact: Library Systems & Web Coordinator