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Formation and structural characterization of Ni nanoparticles embedded in SiO₂

Sprouster, D. J.; Giulian, R.; Araujo, L. L.; Kluth, P.; Johannessen, B.; Kirby, N.; Ridgway, M. C.


Face-centered cubic Ni nanoparticles were formed in SiO₂ by ion implantation and thermal annealing. Small-angle x-ray scattering in conjunction with transmission electron microscopy was used to determine the nanoparticle size as a function of annealing temperature, whereas the local atomic structure was measured with x-ray absorption spectroscopy. The influence of finite-size effects on the nanoparticle structural properties was readily apparent and included a decrease in coordination number...[Show more]

CollectionsANU Research Publications
Date published: 2011-06-07
Type: Journal article
Source: Journal of Applied Physics
DOI: 10.1063/1.3594751


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