Formation and structural characterization of Ni nanoparticles embedded in SiO₂
Face-centered cubic Ni nanoparticles were formed in SiO₂ by ion implantation and thermal annealing. Small-angle x-ray scattering in conjunction with transmission electron microscopy was used to determine the nanoparticle size as a function of annealing temperature, whereas the local atomic structure was measured with x-ray absorption spectroscopy. The influence of finite-size effects on the nanoparticle structural properties was readily apparent and included a decrease in coordination number...[Show more]
|Collections||ANU Research Publications|
|Source:||Journal of Applied Physics|
|01_Sprouster_Formation_and_structural_2011.pdf||Published Version||2.31 MB||Adobe PDF|
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