Granville, S.; Budde, F.; Ruck, B. J.; Trodahl, H. J.; Williams, G. V. M.; Bittar, A.; Ryan, M.; Kennedy, J.; Markwitz, A.; Metson, J. B.; Prince, K. E.; Cairney, J. M.; Ridgway, M. C.
Ga₁ˍₓ Mnₓ Nthin films with a Mn content as high as x=0.18 have been grown using ion-assisted deposition and a combination of Rutherford backscattering spectroscopy and nuclear reaction analysis was used to determine their composition. The structure of the films was determined from x-ray diffraction,transmission electron microscopy, and extended x-ray absorption fine structure(EXAFS). The films are comprised of nanocrystals of random stacked GaMnN and there is no evidence of Mn-rich secondary...[Show more]
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