Single phase nanocrystalline GaMnN thin films with high Mn content
Ga₁ˍₓ Mnₓ Nthin films with a Mn content as high as x=0.18 have been grown using ion-assisted deposition and a combination of Rutherford backscattering spectroscopy and nuclear reaction analysis was used to determine their composition. The structure of the films was determined from x-ray diffraction,transmission electron microscopy, and extended x-ray absorption fine structure(EXAFS). The films are comprised of nanocrystals of random stacked GaMnN and there is no evidence of Mn-rich secondary...[Show more]
|Collections||ANU Research Publications|
|Source:||Journal of Applied Physics|
|01_Granville_Single_phase_nanocrystalline_2006.pdf||463.11 kB||Adobe PDF|
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