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High pressure crystalline phase formation during nanoindentation: Amorphous versus crystalline silicon

Ruffell, S.; Bradby, J. E.; Williams, J. S.

Description

Phase transformations induced by indentation at different unloading rates have been studied in crystalline and amorphous silicon via Raman microspectroscopy and transmission electron microscopy. Unloading was performed at a “slow” rate of ∼0.9mN∕s which is known to create volumes of high pressure phases (Si-III and Si-XII) in crystalline silicon as well as “rapid” unloading (∼1000mN∕s), where amorphous phases are expected. Stark differences between the resulting structures are observed...[Show more]

CollectionsANU Research Publications
Date published: 2006-09-01
Type: Journal article
URI: http://hdl.handle.net/1885/16211
Source: Applied Physics Letters
DOI: 10.1063/1.2339039

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