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Anomalous lattice relaxation mechanics in ZnO/SiC heterostructure

Ashrafi, Almamun; Segawa, Yusaburo

Description

Anomalous lattice relaxation mechanics in ZnOepitaxy deposited on 6H-SiC substrates has been addressed. Thickness-dependent ZnOepitaxy showed that the lattice/strain relaxes into two steps for the layer thicknesses of (i) 10–20 nm, after overcoming the critical thickness of <6 nm and (ii) 480–1000 nm, after the complete strain relaxation. This lattice relaxation contrast has been represented with a schematic model by emphasizing on the tensile and compressive strains associated with the lattice...[Show more]

CollectionsANU Research Publications
Date published: 2008-05-09
Type: Journal article
URI: http://hdl.handle.net/1885/16153
Source: Journal of Applied Physics
DOI: 10.1063/1.2919587

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