Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements
A contactless method to determine the carrier mobility sum in silicon wafers, based on a comparison between photoluminescence and photoconductance measurements is presented. The method is applied to monocrystalline silicon wafers and the results are found to be in good agreement with well-established mobility models and another measurement method. The potential of the proposed method to determine the carrier mobility sum of multicrystalline and compensated silicon wafers is then demonstrated.
|Collections||ANU Research Publications|
|Source:||Applied Physics Letters|
|01_Hameiri_Contactless_determination_of_2014.pdf||Published Version||951.34 kB||Adobe PDF|
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