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Contactless determination of the carrier mobility sum in silicon wafers using combined photoluminescence and photoconductance measurements

Hameiri, Ziv; Rougieux, Fiacre; Sinton, Ron; Trupke, Thorsten


A contactless method to determine the carrier mobility sum in silicon wafers, based on a comparison between photoluminescence and photoconductance measurements is presented. The method is applied to monocrystalline silicon wafers and the results are found to be in good agreement with well-established mobility models and another measurement method. The potential of the proposed method to determine the carrier mobility sum of multicrystalline and compensated silicon wafers is then demonstrated.

CollectionsANU Research Publications
Date published: 2014-02-19
Type: Journal article
Source: Applied Physics Letters
DOI: 10.1063/1.4865804


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