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Contact-induced defect propagation in ZnO

Bradby, J. E.; Kucheyev, S. O.; Williams, J. S.; Jagadish, C.; Swain, M. V.; Munroe, P.; Phillips, M. R.

Description

Contact-induced damage has been studied in single-crystal (wurtzite) ZnO by cross-sectional transmission electron microscopy (XTEM) and scanning cathodoluminescence(CL) monochromatic imaging. XTEM reveals that the prime deformation mechanism in ZnO is the nucleation of slip on both the basal and pyramidal planes. Some indication of dislocation pinning was observed on the basal slip planes. No evidence of either a phase transformation or cracking was observed by XTEM in samples loaded up to 50...[Show more]

CollectionsANU Research Publications
Date published: 2002-06-17
Type: Journal article
URI: http://hdl.handle.net/1885/15984
Source: Applied Physics Letters
DOI: 10.1063/1.1486264

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