Bradby, J. E.; Kucheyev, S. O.; Williams, J. S.; Wong-Leung, J.; Swain, M. V.; Munroe, P.; Li, G.; Phillips, M. R.
The mechanical deformation of wurtzite GaN epilayers grown on sapphire substrates is studied by spherical indentation, cross-sectional transmission electron microscopy (XTEM), and scanning cathodoluminescence(CL) monochromatic imaging. CL imaging of indents which exhibit plastic deformation (based on indentation data) shows an observable “footprint” of deformation-produced defects that result in a strong reduction in the intensity of CL emission. Multiple discontinuities are observed during...[Show more]
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.