Skip navigation
Skip navigation

Electrical transients in the ion-beam-induced nitridation of silicon

Petravic, Mladen; Deenapanray, Prakash N. K.


We have studied the dynamics of the initial stages of silicon nitride formation on siliconsurfaces under nitrogen beam bombardment in the secondary ion mass spectrometry apparatus. We have shown that the secondary ion signal exhibits damped oscillations below the critical impact angle for nitride formation. We have described this oscillatory response by a second-order differential equation and argued that it is initiated by some fluctuations in film thickness followed by the fluctuations in...[Show more]

CollectionsANU Research Publications
Date published: 2001-05-28
Type: Journal article
Source: Applied Physics Letters
DOI: 10.1063/1.1376661


File Description SizeFormat Image
01_Petravic_Electrical_transients_in_the_2001.pdf365.48 kBAdobe PDFThumbnail

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  20 July 2017/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator