Kluth, P.; Johannessen, B.; Giraud, V.; Cheung, A.; Glover, C. J.; Azevedo, G. de M.; Foran, G. J.; Ridgway, M. C.
Au nanocrystals (NCs) fabricated by ion implantation into thin SiO₂ and annealing were investigated by means of extended x-rayabsorption fine structure (EXAFS)spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO₂ matrix. Cumulant analysis of the EXAFS data suggests...[Show more]
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