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Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO[sub 2]

Kluth, P.; Johannessen, B.; Giraud, V.; Cheung, A.; Glover, C. J.; Azevedo, G. de M.; Foran, G. J.; Ridgway, M. C.

Description

Au nanocrystals (NCs) fabricated by ion implantation into thin SiO₂ and annealing were investigated by means of extended x-rayabsorption fine structure (EXAFS)spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO₂ matrix. Cumulant analysis of the EXAFS data suggests...[Show more]

CollectionsANU Research Publications
Date published: 2004-10-18
Type: Journal article
URI: http://hdl.handle.net/1885/15793
Source: Applied Physics Letters
DOI: 10.1063/1.1803619

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