Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO[sub 2]
Au nanocrystals (NCs) fabricated by ion implantation into thin SiO₂ and annealing were investigated by means of extended x-rayabsorption fine structure (EXAFS)spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO₂ matrix. Cumulant analysis of the EXAFS data suggests...[Show more]
|Collections||ANU Research Publications|
|Source:||Applied Physics Letters|
|01_Kluth_Bond_length_contraction_in_Au_2004.pdf||Published Version||219.72 kB||Adobe PDF|
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