Observation of enhanced defect emission and excitonic quenching from spherically indented ZnO
The influence of spherical nanoindentation on the band edge and deep level emission of single crystal c-axis ZnO has been studied by cathodoluminescence(CL) spectroscopy and monochromatic imaging. Excitonic emission is quenched at the indent site and defect emission in the range of 450–720nm is enhanced.
|Collections||ANU Research Publications|
|Source:||Applied Physics Letters|
|01_Coleman_Observation_of_enhanced_defect_2006.pdf||Published Version||364.4 kB||Adobe PDF|