Nastasi, Michael; Höchbauer, Tobias; Lee, Jung-Kun; Misra, Amit; Hirth, John P.; Ridgway, Mark; Lafford, Tamzin
H ion implantation into crystalline Si is known to result in the precipitation of planar defects in the form of platelets. Hydrogen-platelet formation is critical to the process that allows controlled cleavage of Si along the plane of the platelets and subsequent transfer and integration of thinly sliced Si with other substrates. Here we show that H-platelet formation is controlled by the depth of the radiation-induced damage and then develop a model that considers the influence of stress to...[Show more]
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