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Phase-stepping interferometry of GaAs nanowires: determining nano-wire radius

Little, D. J.; Kuruwita, R. L.; Joyce, A.; Gao, Q.; Burgess, Timothy; Jagadish, C.; Kane, D. M.

Description

Phase stepping interferometry is used to measure the size of near-cylindrical nanowires. Nanowires with nominal radii of 25 nm and 50 nm were used to test this by comparing specific measured optical phase profile values with theoretical values calculated using a wave-optic model of the Phase stepping interferometry (PSI) system. Agreement within 10% was found, which enabled nanowire radii to be predicted within 4% of the nominal value. This demonstration highlights the potential capability for...[Show more]

CollectionsANU Research Publications
Date published: 2013-10-15
Type: Journal article
URI: http://hdl.handle.net/1885/15654
Source: Applied Physics Letters
DOI: 10.1063/1.4825153

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