Li, Qian; Liu, Yun; Wang, Danyang; Withers, Ray L.; Li, Zhenrong; Luo, Haosu; Xu, Zhuo
We report a method for switching spectroscopy Kelvin probe force microscopy (SS-KPFM). The method is established as a counterpart to switching spectroscopy piezoresponse force microscopy (SS-PFM) in Kelvin probe force microscopy. SS-KPFM yields quantitative information about the surface charge state during a local bias-induced polarization switching process, complementary to the electromechanical coupling properties probed via SS-PFM. Typical ferroelectric samples of a Pb-based relaxor single...[Show more]
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