On the method of photoluminescence spectral intensity ratio imaging of silicon bricks: Advances and limitations
Spectralphotoluminescenceimaging is able to provide quantitative bulk lifetime and doping images if applied on silicon bricks or thick silicon wafers. A comprehensive study of this new method addresses previously reported artefacts in low lifetime regions and provides a more complete understanding of the technique. Spectrally resolved photoluminescence measurements show that luminescence originating from sub band gap defects does not cause those artefacts. Rather, we find that optical light...[Show more]
|Collections||ANU Research Publications|
|Source:||Journal of Applied Physics|
|01_Mitchell_On_the_method_of_2012.pdf||Published Version||4.57 MB||Adobe PDF|
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