Mitchell, Bernhard; Weber, Jürgen W.; Walter, Daniel; Macdonald, Daniel; Trupke, Thorsten
Spectralphotoluminescenceimaging is able to provide quantitative bulk lifetime and doping images if applied on silicon bricks or thick silicon wafers. A comprehensive study of this new method addresses previously reported artefacts in low lifetime regions and provides a more complete understanding of the technique. Spectrally resolved photoluminescence measurements show that luminescence originating from sub band gap defects does not cause those artefacts. Rather, we find that optical light...[Show more]
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