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SAXS analysis of embedded Pt nanocrystals irradiated with swift heavy Ions

Giulian, R.; Kluth, P.; Sprouster, D. J.; Araujo, L. L.; Byrne, A. P.; Cookson, D. J.; Ridgway, M. C.

Description

Elongated Pt nanocrystals (NCs) formed in SiO2 by ion implantation, thermal annealing and swift heavy ion irradiation were analyzed by small‐angle X‐ray scattering (SAXS) and transmission electron microscopy (TEM) measurements. Transmission SAXS measurements were performed in samples aligned at different angles relative to the photon beam resulting in non‐isotropic scattering and thus enabling the three dimensional analysis of the NCs. Selected angular sectors of the detector were integrated...[Show more]

CollectionsANU Research Publications
Date published: 2009
Type: Journal article
URI: http://hdl.handle.net/1885/15564
Source: AIP Conference Proceedings
DOI: 10.1063/1.3086232

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