Effect of Electrode Roughness on Electroforming in HfO2 and Defect-Induced Moderation of Electric-Field Enhancement
The roughness of Pt electrodes is shown to have a direct impact on the electroforming characteristics of Pt=Ti=HfO2=Pt device structures. Specifically, an increase in roughness leads to a reduction in the electroforming voltage of HfO2, an increase in the failure rate of devices, and a corresponding reduction in resistive switching reliability. A finite-element model is used to investigate the significance of local electricfield enhancement on the breakdown process. This simulation shows that...[Show more]
|Collections||ANU Research Publications|
|Source:||Physical Review Applied|
|Access Rights:||Open Access|
|01_Nandi_Effect_of_Electrode_Roughness_2015.pdf||1.8 MB||Adobe PDF|
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