Impact of carrier profile and rear-side reflection on photoluminescence spectra in Planar Crystalline Silicon Wafers at different temperatures
The increasing use of spectral photoluminescence as an advanced and accurate diagnostic tool motivates a comprehensive assessment of the effects of some important optical and electrical properties on the photoluminescence spectra from crystalline silicon wafers. In this paper, we present both modeling results and measurements to elucidate the effects of the internal reflectance at the planar wafer surfaces, as well as the carrier profile varying across the sample thickness due to an...[Show more]
|Collections||ANU Research Publications|
|Source:||IEEE Journal of Photovoltaics|
|Nguyen et al Impact of Carrier Profile and Rear Side Reflection 2014.pdf||187.52 kB||Adobe PDF|
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