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Nonlinear diffraction in orientation-patterned semiconductors

Karpinski, Pawel; Chen, Xin; Shvedov, Vladlen; Hnatovsky, Kyrylo (Cyril); Grisard, Arnaud; Lallier, Eric; Luther-Davies, Barry; Krolikowski, Wieslaw; Sheng, Yan

Description

This work represents experimental demonstration of nonlinear diffraction in an orientation-patterned semiconducting material. By employing a new transverse geometry of interaction, three types of second-order nonlinear diffraction have been identified according to different configurations of quasi-phase matching conditions. Specifically, nonlinearˇ Cerenkov diffraction is defined by the longitudinal quasi-phase matching condition, nonlinear Raman-Nath diffraction satisfies only the transverse...[Show more]

CollectionsANU Research Publications
Date published: 2015
Type: Journal article
URI: http://hdl.handle.net/1885/152909
Source: Optics Express
DOI: 10.1364/OE.23.014903

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