Nonlinear diffraction in orientation-patterned semiconductors
This work represents experimental demonstration of nonlinear diffraction in an orientation-patterned semiconducting material. By employing a new transverse geometry of interaction, three types of second-order nonlinear diffraction have been identified according to different configurations of quasi-phase matching conditions. Specifically, nonlinearˇ Cerenkov diffraction is defined by the longitudinal quasi-phase matching condition, nonlinear Raman-Nath diffraction satisfies only the transverse...[Show more]
|Collections||ANU Research Publications|
|01_Karpinski_Nonlinear_diffraction_in_2015.pdf||2.32 MB||Adobe PDF|
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.