SIMS and ESD studies of semiconductor structures
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dc.contributor.author | Petravi{u0107}, Mladen | |
---|---|---|
dc.date.accessioned | 2017-12-21T04:02:00Z | |
dc.date.available | 2017-12-21T04:02:00Z | |
dc.date.copyright | 1992 | |
dc.identifier.other | b1826195 | |
dc.identifier.uri | http://hdl.handle.net/1885/138819 | |
dc.format.extent | 171 leaves | |
dc.subject.lcsh | Semiconductors | |
dc.subject.lcsh | Secondary ion mass spectrometry | |
dc.subject.lcsh | Electron-stimulated desorption | |
dc.subject.lcsh | Thin films | |
dc.title | SIMS and ESD studies of semiconductor structures | |
dc.type | Thesis (PhD) | |
local.description.notes | Thesis (Ph.D.)--Australian National University, 1992 | |
dc.date.issued | 1992 | |
local.identifier.doi | 10.25911/5d6c39bc107b1 | |
dc.date.updated | 2017-12-11T01:00:17Z | |
dcterms.license | This thesis has been made available through exception 200AB to the Copyright Act. | |
local.mintdoi | mint | |
Collections | Open Access Theses |
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File | Description | Size | Format | Image |
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