Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers
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Grant, N. E.; Rougieux, F. E.; Macdonald, D.; Bullock, James; Wan, Y.
Description
We investigate a recombination active grown-in defect limiting the bulk lifetime (τ bulk ) of high quality float-zone (FZ) p-type silicon wafers. After annealing the samples at temperatures between 80 °C and 400 °C, τ bulk was found to increase from ∼500 μs to ∼1.5 ms. By isochronal annealing the p-type samples between 80 °C and 400 °C for 30 min, the annihilation energy (Eann ) of the defect was determined to be 0.3 < Eann < 0.7 eV. When the annihilated samples were phosphorus gettered at...[Show more]
dc.contributor.author | Grant, N. E. | |
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dc.contributor.author | Rougieux, F. E. | |
dc.contributor.author | Macdonald, D. | |
dc.contributor.author | Bullock, James | |
dc.contributor.author | Wan, Y. | |
dc.date.accessioned | 2015-06-05T02:57:19Z | |
dc.date.available | 2015-06-05T02:57:19Z | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | http://hdl.handle.net/1885/13796 | |
dc.description.abstract | We investigate a recombination active grown-in defect limiting the bulk lifetime (τ bulk ) of high quality float-zone (FZ) p-type silicon wafers. After annealing the samples at temperatures between 80 °C and 400 °C, τ bulk was found to increase from ∼500 μs to ∼1.5 ms. By isochronal annealing the p-type samples between 80 °C and 400 °C for 30 min, the annihilation energy (Eann ) of the defect was determined to be 0.3 < Eann < 0.7 eV. When the annihilated samples were phosphorus gettered at 880 °C or subject to 0.2 sun illumination for 24 h, τ bulk was found to degrade. However, when the samples were subsequently annealed at temperatures between 250 and 400 °C, the defect could be re-annihilated. The experimental results suggest that the defect limiting the lifetime in the p-type FZ silicon is not related to fast diffusing metallic impurities but rather to a lattice-impurity or an impurity-impurity metastable defect. | |
dc.description.sponsorship | This work has been supported by the Australian Renewable Energy Agency (ARENA) fellowships program and the Australian Research Council (ARC) Future Fellowships program. | |
dc.format | 9 pages | |
dc.publisher | American Institute of Physics | |
dc.rights | © American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. | |
dc.rights | http://www.sherpa.ac.uk/romeo/issn/0021-8979/..."Publishers version/PDF may be used on author's personal website, institutional website or institutional repository" from SHERPA/RoMEO site (as at 4/06/15). The following article appeared in Journal of Applied Physics, Vol. 117, Issue 5, Article No. 055711 (9 pages) and may be found at https://dx.doi.org/10.1063/1.4907804 | |
dc.source | Journal of Applied Physics | |
dc.title | Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers | |
dc.type | Journal article | |
local.identifier.citationvolume | 117 | |
dcterms.dateAccepted | 2015-01-28 | |
dc.date.issued | 2015-02-06 | |
local.identifier.absfor | 090605 - Photodetectors, Optical Sensors and Solar Cells | |
local.identifier.ariespublication | a383154xPUB1179 | |
local.type.status | Published Version | |
local.contributor.affiliation | Grant, N. E., Research School of Engineering, College of Engineering and Computer Science, The Australian National University | |
local.contributor.affiliation | Rougieux, F. E., Research School of Engineering, College of Engineering and Computer Science, The Australian National University | |
local.contributor.affiliation | Macdonald, D., Research School of Engineering, College of Engineering and Computer Science, The Australian National University | |
local.contributor.affiliation | Bullock, J., Research School of Engineering, College of Engineering and Computer Science, The Australian National University | |
local.contributor.affiliation | Wan, Y., Research School of Engineering, College of Engineering and Computer Science, The Australian National University | |
local.bibliographicCitation.issue | 5 | |
local.bibliographicCitation.startpage | 055711 | |
local.bibliographicCitation.lastpage | 8 | |
local.identifier.doi | 10.1063/1.4907804 | |
local.identifier.absseo | 850504 - Solar-Photovoltaic Energy | |
dc.date.updated | 2016-06-14T08:27:58Z | |
local.identifier.scopusID | 2-s2.0-84923658473 | |
Collections | ANU Research Publications |
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