Analysis of multi-layer ERBS spectra
A systematic way of analysis of multi-layer electron Rutherford backscattering spectra is described. The approach uses fitting in terms of physical meaningful parameters. Simultaneous analysis then becomes possible for spectra taken at different incoming energies and measurement geometries. Examples are given to demonstrate the level of detail that can be resolved by this technique.
|Collections||ANU Research Publications|
|Source:||Journal of Electron Spectroscopy and Related Phenomena|